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Numerical Models of the Electrochemical Migration: a short review

Gharaibeh, Ali and Illés, Balázs and Géczy, Attila and Medgyes, Bálint (2020) Numerical Models of the Electrochemical Migration: a short review. In: 2020 IEEE 26th International Symposium for Design and Technology in Electronic Packaging (SIITME). (In Press)

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Abstract

Electrochemical migration has attracted more attention from researchers due to its high risk of electronics reliability. It is a multistage process that may result in catastrophic failure of electronics. The growing interest of this phenomenon requires precise modeling to predict the time-to-failure, which consists of two main stages, incubation and growth of dendrites. This paper presents a short overview regarding the ECM process, main factors affecting the process, the main historical numerical models for electrochemical deposition in electrochemistry, electrochemical migration on electronics, and the importance of machine learning in building up more precise lifetime models compared to physics of failure models.

Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology / alkalmazott, műszaki tudományok > TJ Mechanical engineering and machinery / gépészmérnöki tudományok
T Technology / alkalmazott, műszaki tudományok > TK Electrical engineering. Electronics Nuclear engineering / elektrotechnika, elektronika, atomtechnika
Depositing User: Dr Attila Géczy
Date Deposited: 29 Dec 2020 08:53
Last Modified: 29 Dec 2020 08:53
URI: http://real.mtak.hu/id/eprint/118897

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