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Optical analysis of room temperature magnetron sputtered ITO films by reflectometry and spectroscopic ellipsometry

Lohner, Tivadar and Jagadeesh Kumar, K. and Petrik, Péter and Subrahmanyam, Aryasomayajula and Bársony, István (2014) Optical analysis of room temperature magnetron sputtered ITO films by reflectometry and spectroscopic ellipsometry. Journal of Materials Research, 29 (14). pp. 1528-1536. ISSN 0884-2914 (print), 2044-5326 (online)

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Item Type: Article
Subjects: Q Science / természettudomány > Q1 Science (General) / természettudomány általában
SWORD Depositor: MTMT SWORD
Depositing User: MTMT SWORD
Date Deposited: 17 Oct 2014 08:02
Last Modified: 17 Oct 2014 08:02
URI: http://real.mtak.hu/id/eprint/17722

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