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Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires

Fodor, Bálint and Defforge, Thomas and Agócs, Emil and Fried, Miklós and Gautier, Gaël and Petrik, Péter (2016) Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires. APPLIED SURFACE SCIENCE. pp. 1-8. ISSN 0169-4332

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Item Type: Article
Uncontrolled Keywords: Birefringence; Anisotropy; In-depth gradient; MORPHOLOGY; Effective Medium Approximation; SILICON NANOWIRES; Porous silicon layer; spectroscopic ellipsometry
Subjects: Q Science / természettudomány > QC Physics / fizika
Q Science / természettudomány > QD Chemistry / kémia > QD02 Physical chemistry / fizikai kémia
SWORD Depositor: MTMT SWORD
Depositing User: MTMT SWORD
Date Deposited: 11 Jan 2017 14:43
Last Modified: 11 Jan 2017 14:43
URI: http://real.mtak.hu/id/eprint/45112

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