Genotype by Yield*Trait Biplot for Genotype Evaluation and Trait Profiles in Durum Wheat

Mohammadi, R. (2019) Genotype by Yield*Trait Biplot for Genotype Evaluation and Trait Profiles in Durum Wheat. Cereal Research Communications, 47 (3). pp. 541-551. ISSN 0133-3720

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Abstract

Genotype selection based on multiple traits in multi-years is frequently influenced by unpredictable rainfed conditions. The main objective of the study was to apply the new methodology of genotype by yield*trait (GYT) biplot for genotype selection and trait profiles in durum wheat genotypes based on multi-traits and multi-year data under rainfed conditions of Iran. A superiority index was applied based on GYT table for ranking of genotypes by the mean of all traits. The GYT biplot ranked the genotypes based on their levels in combining yield with other key traits. Grain yield was combined with target traits and showed the strengths and weaknesses of each genotype. Based on GYT-biplots the relationships among the studied traits were not repeatable across years, but they facilitated visual genotype comparisons and selection. The breeding lines G13, G10 and G15 ranked as the best in combination of the morph-physiological traits i.e., SPAD-reading, early heading, flag-leaf length and number of grain per spike with grain yield under rainfed conditions. The results indicate that there is a potential for simultaneous improvement of some characteristics of durum wheat under rainfed conditions. The GYT biplot was a useful tool for exploring the combination of yield with traits and trait profiles of the durum genotypes to obtain high genetic gains in the durum breeding programs.

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