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Items where Author is "Defforge, Thomas"
Group by: Item Type | No Grouping Jump to: Article | Conference or Workshop Item Number of items: 5. ArticleBin, Lu and Defforge, Thomas and Fodor, Bálint and Morillon, Benjamin and Alquier, Daniel (2016) Optimized plasma-polymerized fluoropolymer mask for local porous silicon formation. Journal of Applied Physics, 119 (21). pp. 1-8. ISSN 0021-8979 (print), 1089-7550 (online) Fodor, Bálint and Agócs, Emil and Bardet, Benjamin and Defforge, Thomas and Cayrel, Frederic and Fried, Miklós and Petrik, Péter (2016) Porosity and thickness characterization of porous Si and oxidized porous Si layers – an ultraviolet-visible-mid infrared ellipsometry study. MICROPOROUS and Mesoporous Materials, in pre. in press. ISSN 1387-1811 Fodor, Bálint and Defforge, Thomas and Agócs, Emil and Fried, Miklós and Gautier, Gaël and Petrik, Péter (2016) Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires. APPLIED SURFACE SCIENCE. pp. 1-8. ISSN 0169-4332 Conference or Workshop ItemKalas, Benjámin and Defforge, Thomas and Gautier, Gaël and Chaix, Arnaud and Fried, Miklós and Petrik, Péter (2022) Development of Advanced Sensing Materials and Interface Structures for In-Situ Bioellipsometry. In: Label-free Biomedical Imaging and Sensing (SPIE BIOS 2022), 2022. március 2., San Francisco (CA). Defforge, Thomas and Chaix, Arnaud and Kalas, Benjámin and Fried, Miklós and Petrik, Péter (2022) Development of Silicon Nanoparticles for Plasmonic Sensing. In: Colloidal Nanoparticles for Biomedical Applications XVII (SPIE BIOS 2022), 2022. március 3., San Francisco (CA). |
