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Items where Author is "Gautier, Gaël"
Group by: Item Type | No Grouping Jump to: Article | Conference or Workshop Item Number of items: 2. ArticleFodor, Bálint and Defforge, Thomas and Agócs, Emil and Fried, Miklós and Gautier, Gaël and Petrik, Péter (2016) Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires. APPLIED SURFACE SCIENCE. pp. 1-8. ISSN 0169-4332 Conference or Workshop ItemKalas, Benjámin and Defforge, Thomas and Gautier, Gaël and Chaix, Arnaud and Fried, Miklós and Petrik, Péter (2022) Development of Advanced Sensing Materials and Interface Structures for In-Situ Bioellipsometry. In: Label-free Biomedical Imaging and Sensing (SPIE BIOS 2022), 2022. március 2., San Francisco (CA). |
