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Items where Author is "Gumprechte, T."
Group by: Item Type | No Grouping Jump to: Article Number of items: 2. ArticleGumprechte, T. and Petrik, Péter and Roeder, G. and Schellenberger, M. and Pfitzner, L. and Pollakowski, B. and Beckhoff, B. (2013) Characterization of thin ZnO films by vacuum ultra-violet reflectometry. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, 1494. pp. 65-70. ISSN 0272-9172 Petrik, Péter and Gumprechte, T. and Nutscha, A. and Juhász, György and Polgár, Olivér and Major, Csaba and Kozma, Péter and Agócs, Emil and Fried, Miklós (2013) Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry. Thin Solid Films, 541. pp. 131-135. ISSN 0040-6090 |
