REAL

Items where Author is "Lohner, Tivadar"

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Number of items: 18.

Article

Petrik, Péter and Agócs, Emil and Volk, János and Lukács, István Endre and Fodor, Bálint and Kozma, Péter and Lohner, Tivadar and Fried, Miklós (2014) Resolving lateral and vertical structures by ellipsometry using wavelength range scan. THIN SOLID FILMS. ISSN 0040-6090 (In Press)

Lohner, Tivadar and Agócs, Emil and Petrik, Péter and Zolnai, Zsolt and Szilágyi, Edit and Kovács, Imre and Szőkefalvi-Nagy, Zoltán and Tóth, Lajos and Tóth, Attila Lajos and Bársony, István (2014) Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration. THIN SOLID FILMS, 550. ISSN 0040-6090 (In Press)

Bányász, István and Fried, Miklós and Lohner, Tivadar and Conti, G. N. and Righini, G. C. and Pelli, S. and Zolnai, Zsolt (2013) M-line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applications. THIN SOLID FILMS, 541. pp. 3-8. ISSN 0040-6090

Bányász, István and Zolnai, Zsolt and Fried, Miklós and Lohner, Tivadar and Berneschi, S. and Righini, GC. and Pelli, S. and Nunzi-Conti, G. (2013) Single- and double energy N+ ion irradiated planar optical waveguides in Er: Tungsten-tellurite oxide glass and sillenite type Bismuth Germanate crystals working up to telecommunications wavelengths. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 307. pp. 299-304. ISSN 0168-583X

Bányász, István and Zolnai, Zsolt and Pelli, S. and Berneschi, S. and Fried, Miklós and Lohner, Tivadar and Nunzi-Conti, G. and Righini, G. C. (2013) Single- and double-energy N+ - Irradiated planar waveguides in eulytine and sillenite type BGO crystals. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 8627. pp. 1-11. ISSN 0277-786X

Lohner, Tivadar and Csíkvári, P. and Petrik, Péter and Hárs, György (2013) Spectroellipsometric characterization of nanocrystalline diamond layers. Applied Surface Science, 281. pp. 113-117. ISSN 0169-4332

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Zolnai, Zsolt and Horváth, Zsolt Endre and Nguyen Quoc, Khánh (2008) Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction. THIN SOLID FILMS, 516 (22). pp. 8096-8100. ISSN 0040-6090

Lohner, Tivadar and Serényi, Miklós and Basa, D.K. and Nguyen Quoc, Khánh and Nemcsics, Ákos and Petrik, Péter and Turmezei, Péter (2008) Composition and Thickness of RE Sputtered Amorphous Silicon Alloy Films. ACTA POLYTECHNICA HUNGARICA, 5 (2). pp. 23-30. ISSN 1785-8860

Basa, Péter and Alagoz, A. S. and Lohner, Tivadar and Kulakci, M. and Turan, R. and Horváth, Zsolt József (2008) Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals. APPLIED SURFACE SCIENCE, 254 (12). pp. 3626-3629. ISSN 0169-4332

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Frigeri, C. (2007) Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy. Thin Solid Films, 515 (7-8). pp. 3559-3562. ISSN 0040-6090

Serényi, Miklós and Rácz, Miklós and Lohner, Tivadar (2001) Refractive index of sputtered silicon oxynitride layers for antireflection coating. VACUUM, 61 (2-4). pp. 245-249. ISSN 0042-207X

Book Section

Petrik, Péter and Kumar, N. and Agócs, Emil and Fodor, Bálint and Pereira, S. F. and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of laterally and vertically structured oxides and semiconductors. In: 5th Annual Oxide Based Materials and Devices Conference. Proceedings of SPIE - The International Society for Optical Engineering (8987). SPIE, San Francisco, 89870E. ISBN 9780819499004

Horváth, Zsolt József and Basa, Péter and Petrik, Péter and Dücső, Csaba and Jászi, T. and Dobos, László and Tóth, Lajos and Lohner, Tivadar and Pécz, Béla and Fried, Miklós (2005) Si nanocrystals in sandwiched SiNx structures. In: Semiconductor nanocrystals. MTA MFA, Budapest, pp. 417-420. ISBN 963-7371-18-4

Monograph

Bakonyi, Imre and Lohner, Tivadar and Molnár, György and Neuróhr, Katalin and Pekker, Áron and Péter, László and Pogány, Lajos and Révész, Ádám and Szász, Krisztián and Tóth, Bence (2013) Óriás mágneses ellenállás (GMR) elektrolitikus multirétegekben = Giant magnetoresistance (GMR) in electrodeposited multilayers. Project Report. OTKA.

Fried, Miklós and Lohner, Tivadar and Nguyen, Quoc Khanh (2008) Optikai modellek fejlesztése sokösszetevős anyagrendszerek ellipszometriai vizsgálatához = Optical model development for ellipsometric study of many-compound materials. Project Report. OTKA.

Fried, Miklós and Lohner, Tivadar and Nguyen, Quoc Khanh and Petrik, Péter (2008) Optikai modellek fejlesztése sokösszetevős anyagrendszerek ellipszometriai vizsgálatához = Optical model development for ellipsometric study of many-compound materials. Project Report. OTKA.

Gyulai, József and Arató, Péter and Balázsi, Csaba and Battistig, Gábor and Biró, László Péter and Hárs, György and Lábadi, Zoltán and Lohner, Tivadar and Makkai, Zsolt and Menyhárd, Miklós and Nguyen, Quoc Khanh and Pászti, Ferenc and Petrik, Péter and Ster, András and Tóth, Lajos and Vargáné dr. Josepovits, Katalin (2007) Ionsugaras módszerek a fizikai nanotechnológiában (IONNANO) = Ion beam modifications in near-to-physics nanotechnology. Project Report. OTKA.

Dózsa, László and Vo, Van Tuyen and Tóth, Attila Lajos and Somogyi, Károly and Lohner, Tivadar and Szentpáli, Béla (2007) SiC és más nagy tiltott sávú félvezető anyagok kutatása = Research of SiC and other wide band gap semiconductor materials. Project Report. OTKA.

This list was generated on Wed Sep 3 08:58:45 2014 CEST.