REAL

Items where Author is "Major, Csaba"

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Jump to: Article
Number of items: 9.

Article

Nugusse, Berhane and Juhász, György and Major, Csaba and Petrik, Péter and Kálvin, Sándor and Horváth, Zoltán György and Fried, Miklós (2023) Multi-Color Ellipsometric Mapping Tool from Cheap Parts. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 12428. pp. 134-141. ISSN 0277-786X (print); 1996-756X (online)

Kócs, Lenke and Tegze, Borbála and Albert, Emőke and Major, Csaba and Szalai, András and Fodor, Bálint and Basa, Péter and Sáfrán, György and Hórvölgyi, Zoltán (2021) Ammonia-vapour-induced two-layer transformation of mesoporous silica coatings on various substrates. VACUUM, 192. pp. 1-9. ISSN 0042-207X (print); 1879-2715 (online)

Szilágyi, Edit and Bányász, István and Kótai, Endre and Németh, Attila and Major, Csaba and Fried, Miklós and Battistig, Gábor (2015) Determination of migration of ion-implanted Ar and Zn in silica by backscattering spectrometry. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 170 (3). pp. 229-237. ISSN 1042-0150

Fried, Miklós and Major, Csaba and Juhász, György and Petrik, Péter and Horváth, Zoltán György (2015) Expanded beam speetro-ellipsometry for big area on-line monitoring. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9525. pp. 1-12. ISSN 0277-786X

Petrik, Péter and Fodor, Bálint and Agócs, Emil and Kozma, Péter and Nádor, Judit and Juhász, György and Major, Csaba (2015) Methods for optical modeling and cross-checking in ellipsometry and scatterometry. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9526. pp. 1-11. ISSN 0277-786X (Unpublished)

Petrik, Péter and Agócs, Emil and Kalas, B. and Kozma, Péter and Fodor, Bálint and Nádor, Judit and Major, Csaba and Fried, Miklós (2015) Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9529. pp. 1-5. ISSN 0277-786X

Petrik, Péter and Kumar, N and Juhász, György and Major, Csaba and Fodor, Bálint and Agócs, Emil and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of macro-, micro- and nanostructures using polarized light. JOURNAL OF PHYSICS-CONFERENCE SERIES, 558 (1). 012008. ISSN 1742-6588

Petrik, Péter and Gumprechte, T. and Nutscha, A. and Juhász, György and Polgár, Olivér and Major, Csaba and Kozma, Péter and Agócs, Emil and Fried, Miklós (2013) Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry. Thin Solid Films, 541. pp. 131-135. ISSN 0040-6090

Shan, Ambalanath and Fried, Miklós and Juhász, György and Major, Csaba and Polgár, Olivér and Németh, Ágoston and Petrik, Péter (2013) High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin Film Photovoltaics. IEEE JOURNAL OF PHOTOVOLTAICS, 4 (1). pp. 355-361. ISSN 2156-3381

This list was generated on Fri Mar 29 14:22:12 2024 CET.