Electron Diffraction Based Analysis of Phase Fractions and Texture in Nanocrystalline Thin Films, Part III: Application Examples

Lábár, János and Adamik, Miklós and Barna B., Péter and Czigány, Zsolt and Fogarassy, Zsolt and Horváth, Zsolt Endre and Geszti, Olga and Misják, Fanni and Radnóczi, György and Sáfrán, György and Székely, Lajos (2012) Electron Diffraction Based Analysis of Phase Fractions and Texture in Nanocrystalline Thin Films, Part III: Application Examples. MICROSCOPY AND MICROANALYSIS, 18 (2). pp. 406-420. ISSN 1431-9276


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In this series of articles, a method is presented that performs (semi) quantitative phase analysis for nanocrystalline transmission electron microscope samples from selected area electron diffraction (SAED) patterns. Volume fractions and degree of fiber texture are determined for the nanocrystalline components. The effect of the amorphous component is minimized by empirical background interpolation. First, the two-dimensional SAED pattern is converted into a one-dimensional distribution similar to X-ray diffraction. Volume fractions of the nanocrystalline components are determined by fitting the spectral components, calculated for the previously identified phases with a priori known structures. These Markers are calculated not only for kinematic conditions, but the Blackwell correction is also applied to take into account dynamic effects for medium thicknesses. Peak shapes and experimental parameters (camera length, etc.) are refined during the fitting iterations. Parameter space is explored with the help of the Downhill-SIMPLEX. The method is implemented in a computer program that runs under the Windows operating system. Part I presented the principles, while part II elaborated current implementation. The present part III demonstrates the usage and efficiency of the computer program by numerous examples. The suggested experimental protocol should be of benefit in experiments aimed at phase analysis using electron diffraction methods.

Item Type: Article
Uncontrolled Keywords: computer program; TEM; quantitative analysis; texture; phase fractions; thin films; nanocrystals; ring patterns; SAED; electron diffraction
Subjects: Q Science / természettudomány > QC Physics / fizika
Depositing User: MTMT SWORD
Date Deposited: 15 Sep 2014 13:06
Last Modified: 15 Sep 2014 13:06

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