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Influence of surface roughness on interdiffusion processes in InGaP/Ge heteroepitaxial thin films

Sophia, P. Joice and Attolini, G. and Bosi, M. and Buffagni, E. and Ferrari, C. and Vad, Kálmán and Csik, Attila and Takáts, Viktor and Zolnai, Zsolt (2015) Influence of surface roughness on interdiffusion processes in InGaP/Ge heteroepitaxial thin films. ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 4 (3). P53-P56. ISSN 2162-8769

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Item Type: Article
Uncontrolled Keywords: Materials Science and Analytics
Subjects: Q Science / természettudomány > QC Physics / fizika
SWORD Depositor: MTMT SWORD
Depositing User: MTMT SWORD
Date Deposited: 19 Jun 2015 11:28
Last Modified: 19 Jun 2015 11:28
URI: http://real.mtak.hu/id/eprint/24878

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