Gubicza, Jenő and Dragomir, I. C. and Ribárik, Gábor and Zhu, Y. T. and Valiev, R. Z. and Ungár, Tamás (2003) Characterization of the microstructure of severely deformed titanium by X-ray diffraction profile analysis. In: 3rd Hungarian Conference and Exhibition on Materials Science, Testing and Informatics, 2001. október 14-17., Balatonfüred, Magyarország.
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Nanocrystalline titanium was produced by equal channel angular pressing (ECAP). It was found that during ECAP a texture evolved in the specimen in which the hexagonal "c" axis is perpendicular to the extrusion direction. The crystallite size distribution and the dislocation structure were determined by fitting ab-initio theoretical functions to the Fourier coefficients of the measured X-ray diffraction peak profiles. The peak profile analysis provided the median and the variance of the crystallite size distribution: m=38 nm and sigma=0.49, respectively. The dislocation slip system population was found to be 75% <a> type, 20% <c> type and 5% <c+a> type.
|Item Type:||Conference or Workshop Item (Paper)|
|Subjects:||Q Science / természettudomány > QC Physics / fizika|
|Depositing User:||Erika Bilicsi|
|Date Deposited:||15 Oct 2012 12:44|
|Last Modified:||15 Oct 2012 12:44|
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