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Microstructure of diamond–SiC nanocomposites determined by X-ray line profile analysis

Gubicza, Jenő and Ungár, Tamás and Wang, Y. and Voronin, G. and Pantea, C. and Zerda, T.W. (2006) Microstructure of diamond–SiC nanocomposites determined by X-ray line profile analysis. Diamond and Related Materials, 15 (9). pp. 1452-1456. ISSN 0925-9635

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Abstract

Diamond composites with nanosize diamond crystals and nanosize SiC matrix were obtained at 8 GPa and temperatures varied between 1800 and 2000 degrees C. Multiple Whole Profile fitting method applied to X-ray diffractograms of sintered composites provided information on crystallite size and population of dislocations. When the temperature was increased at a constant pressure, it led to a growth of crystallite sizes in both phases and reduced population of dislocations. Porosity was limiting hardness of the specimens indicating importance of sample preparation prior to sintering nanosize diamond powders.

Item Type: Article
Subjects: Q Science / természettudomány > QC Physics / fizika
Q Science / természettudomány > QC Physics / fizika > QC06 Physics of condensed matter / szilárdtestfizika
Depositing User: Erika Bilicsi
Date Deposited: 03 Apr 2013 07:25
Last Modified: 03 Apr 2013 07:25
URI: http://real.mtak.hu/id/eprint/4547

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