Fogarassy, Zsolt and Dobrik, Gergely and Varga, Lajos Károly and Biró, László Péter and Lábár, János (2013) Growth of Ni layers on single crystal sapphire substrates. THIN SOLID FILMS, 539. pp. 96-101. ISSN 0040-6090
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Abstract
Ni single crystal films have been grown by sputtering on the (0001) basal plane of sapphire varying temperature, flux and substrate bias. In the full parameter range epitaxial growth was observed by transmission electron microscopy. The (111) planes of fcc single crystal Ni grow parallel to the substrate surface. Surprisingly, two alternative planes of Ni were parallel to the sapphire (10-10) planes in different domains, either the nickel {110} planes (“A” orientation) or its {211} planes (“B” orientation). In all cases twinned areas appeared in both domains. Changing the flux, the temperature and the bias, it was possible to vary the ratio of the two orientations and to reach that only one orientation remained in a given sample. The phenomenon can be explained by differences in cohesion and elastic strain in the two domains.
Item Type: | Article |
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Uncontrolled Keywords: | Ni; sapphire; sputtering; epitaxial; singe crystal; double-position; TEM; AFM |
Subjects: | Q Science / természettudomány > QC Physics / fizika |
SWORD Depositor: | MTMT SWORD |
Depositing User: | MTMT SWORD |
Date Deposited: | 24 Jun 2013 09:51 |
Last Modified: | 24 Jun 2013 09:51 |
URI: | http://real.mtak.hu/id/eprint/5688 |
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