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A new method to measure fast defect transients in semiconductor and/or insulator samples

Dózsa, László (1992) A new method to measure fast defect transients in semiconductor and/or insulator samples. SOLID-STATE ELECTRONICS, 35 (2). pp. 228-230. ISSN 0038-1101

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Item Type: Article
Subjects: Q Science / természettudomány > QC Physics / fizika
Q Science / természettudomány > QC Physics / fizika > QC06 Physics of condensed matter / szilárdtestfizika
T Technology / alkalmazott, műszaki tudományok > TA Engineering (General). Civil engineering (General) / általános mérnöki tudományok
T Technology / alkalmazott, műszaki tudományok > TK Electrical engineering. Electronics Nuclear engineering / elektrotechnika, elektronika, atomtechnika
SWORD Depositor: MTMT SWORD
Depositing User: MTMT SWORD
Date Deposited: 13 Nov 2013 11:14
Last Modified: 13 Nov 2013 11:14
URI: http://real.mtak.hu/id/eprint/7277

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