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Items where Author is "Knaup, J."

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Article

Knaup, J. and Deák, P. and Frauenheim, Th. and Gali, Ádám and Hajnal, Zoltán and Choyke, W. (2005) Defects in SiO2 as the possible origin of near interface traps in the SiC∕SiO2 system: A systematic theoretical study. Physical Review B (Condensed Matter and Materials Physics), 72 (11). No. 115323. ISSN 1098-0121

Deák, P. and Gali, Ádám and Knaup, J. and Hajnal, Zoltán and Frauenheim, Th. and Ordejón, P. and Choyke, J.W. (2003) Defects of the SiC/SiO2 interface: energetics of the elementary steps of the oxidation reaction. Physica B: Condensed Matter, 340-42. pp. 1069-1073. ISSN 0921-4526

This list was generated on Tue Aug 11 15:39:20 2020 CEST.