Reversed texture in nanometric carbon/boron nitride multilayers

Torres, R. and Caretti, I. and Serin, V. and Brun, N. and Radnóczi, György (2014) Reversed texture in nanometric carbon/boron nitride multilayers. Carbon, 74. pp. 374-378. ISSN 0008-6223

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Abstract

A structure-controlled series of carbon/boron nitride multilayers, with bilayer thicknesses from 1.25 to 160 nm has been grown by sequential evaporation of carbon and boron assisted with nitrogen ions. The minimum bilayer thickness for a stable stack is 2.9 nm. A turbostratic texture of the carbon and BN phases is evidenced even for small periods of the bilayers. Interestingly, BN and C basal planes of adjacent sub-layers exhibit perpendicular alignment between them: along the growth direction for h-BN rich layers, and parallel to the surface for the C rich ones. © 2014 Elsevier Ltd. All rights reserved.

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