Virosztek, Tamás and Kollár, István (2014) ADC Testing in Standard and Non-standard Ways, Executed in a Unified Framework. In: 20th IMEKO TC4 International Symposium and 18th International Workshop on ADC Modelling and Testing Research on Electric and Electronic Measurement for the Economic Upturn, 2014.09.15-2014.09.17, Benevento.
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Abstract
Several test methods are available to examine static and dynamic properties of analog to digital converters (ADCs). The most robust and straightforward ones are codified in international standards released by the IEEE, or by the IEC. These methods have been improved based on ideas proposed in scientific papers published in the field of ADC testing. However, there are algorithms and test techniques that are not yet standardized, but could be very useful to achieve more information concerning the device under test. These are predominantly amendments of the standard methods, elaborated to increase the accuracy, robustness, computation demand, etc. Nevertheless, it is important to be able to test ADCs strictly according to the standards, and it can also be important to use methods that go beyond the standardized ones in some aspects. This paper presents an idea to harmonize standard and non standard ADC test methods in a single software tool on widely used platform.
Item Type: | Conference or Workshop Item (Paper) |
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Additional Information: | MTMT: 2720264 In.: 20th IMEKO TC4 International Symposium and 18th International Workshop on ADC Modelling and Testing Research on Electric and Electronic Measurement for the Economic Upturn. 2014. Konferencia helye, ideje: Benevento, Olaszország, 2014.09.15.-2014.09.17. |
Subjects: | Q Science / természettudomány > QA Mathematics / matematika > QA75 Electronic computers. Computer science / számítástechnika, számítógéptudomány |
SWORD Depositor: | MTMT SWORD |
Depositing User: | MTMT SWORD |
Date Deposited: | 05 Sep 2014 11:30 |
Last Modified: | 11 Sep 2014 02:48 |
URI: | http://real.mtak.hu/id/eprint/14452 |
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