Györök, György and Beszédes, Bertalan (2017) Duplicated Control Unit Based Embedded Fault-masking Systems. In: 2017 IEEE 15th International Symposium on Intelligent Systems and Informatics (SISY). IEEE, New York, Amerikai Egyesült Államok, pp. 283-288.
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Abstract
Fault-masking architectures are classified into a few major categories. The first is the multiplication of the microcontroller, the other is a CON-MON architecture (not a full-fledged fault-masking system), there is of course, the multiplication of frequently failing units. In this article, the focus is on the different kind of solutions, how can a duplicated microcontroller based system, monitoring itself, and increasing the fault-tolerance level of the embedded system.
| Item Type: | Book Section |
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| Subjects: | T Technology / alkalmazott, műszaki tudományok > TK Electrical engineering. Electronics Nuclear engineering / elektrotechnika, elektronika, atomtechnika |
| Depositing User: | Bertalan Beszédes |
| Date Deposited: | 30 Jan 2023 13:35 |
| Last Modified: | 30 Jan 2023 13:35 |
| URI: | http://real.mtak.hu/id/eprint/157648 |
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