Inheritance of some flag leaf and yield characteristics by half-diallel analysis in rice crops (Oryza Sativa L.)

Bassuony, Nessreen N. and Zsembeli, József (2021) Inheritance of some flag leaf and yield characteristics by half-diallel analysis in rice crops (Oryza Sativa L.). CEREAL RESEARCH COMMUNICATIONS, 49 (3). pp. 503-510. ISSN 0133-3720 (print), 1788-9170 (online)

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Abstract

This study was conducted during 2018 and 2019 at the Rice Research and Training Centre farm, Sakha, Kafr el Sheikh, Egypt. Six genotypes of rice, Sakha 101, Giza 178, Irat 170, Wab-56-104, IR65500-127 and IR69853 were half-diallel crossed to estimate the combining ability effect as well as sink and yield potential in rice. Sink capacity (number of spikelets/panicle and 1000-grain weight), source leaf (flag leaf length, flag leaf width and flag leaf area), source-sink association (number of spikelets/panicle to flag leaf area ratio) and traits of yield components (filled grains number/panicle and panicle number) plant and grain yield/plant) were analysed. The results indicated that both general and specific combining ability were highly significant for all the studied characteristics. IR65500-127, Giza 178, and Sakha 101 were identified as good parents, so these parents were suggested for a further recombinant breeding programme. The cross of 3 × 5 was found to be superior for flag leaf width and grain yield, while the cross of 1 × 4 was found to be superior for flag leaf length, flag leaf length/width ratio, chlorophyll content and number of panicles/plant. Advancing these crosses and effected selections in segregating generation would be helpful to develop high yielding varieties. The genetic parameter showed a dominant deviation in one direction was controlled for all characters except flag leaf length. The analysis of the regression line showed that the over-dominance played an important role in the inheritance of gene action for grain yield/plant.

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