Acín, A. and Pironio, S. and Vértesi, Tamás and Wittek, P. (2016) Optimal randomness certification from one entangled bit. PHYSICAL REVIEW A, 93 (4). ISSN 2469-9926
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Official URL: https://doi.org/10.1103/PhysRevA.93.040102
Abstract
By performing local projective measurements on a two-qubit entangled state one can certify in a device-independent way up to one bit of randomness. We show here that general measurements, defined by positive-operator-valued measures, can certify up to two bits of randomness, which is the optimal amount of randomness that can be certified from an entangled bit. General measurements thus provide an advantage over projective ones for device-independent randomness certification.
| Item Type: | Article |
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| Uncontrolled Keywords: | Random processes; quantum entanglement; Two-qubit; Positive operator valued measure; Local projective; |
| Subjects: | Q Science / természettudomány > QC Physics / fizika |
| SWORD Depositor: | MTMT SWORD |
| Depositing User: | MTMT SWORD |
| Date Deposited: | 25 Jan 2024 14:40 |
| Last Modified: | 25 Jan 2024 14:40 |
| URI: | http://real.mtak.hu/id/eprint/185997 |
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