Dodony, Erzsébet and Dódony, István and Sáfrán, György (2024) EDIC Intensity Correction of Electron Diffraction. MICRON, 183. No.-103649. ISSN 0968-4328 (print); 1878-4291 (online)
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Abstract
Transmission electron microscopy (TEM) has recently become indispensable in determining crystal structures. The location of atoms in crystals can be determined using electron diffraction (ED) intensity data series if the diffracted intensities are directly proportional to the square of the structure factor (|Fhkl|2). However, due to the crystal thickness, the used electron wavelength and the potential misalignment of the measured crystal the detected intensities differ from the ideal values. A method, Electron Diffraction Intensity Correction (EDIC), and a computer program have been developed to recover the ideal |Fhkl|2 proportional intensities from experimental data for kinematic scattering, for further structure studies.
Item Type: | Article |
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Uncontrolled Keywords: | Transmission electron microscopy, Electron diffraction pattern, Crystal structure, Electron diffraction intensity correction, Crystallographic misorientation |
Subjects: | Q Science / természettudomány > QD Chemistry / kémia > QD02 Physical chemistry / fizikai kémia |
SWORD Depositor: | MTMT SWORD |
Depositing User: | MTMT SWORD |
Date Deposited: | 14 May 2024 13:06 |
Last Modified: | 14 May 2024 13:06 |
URI: | https://real.mtak.hu/id/eprint/194899 |
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