Rozgonyi, Áron and Széchenyi, Gábor (2023) Break-even point of the phase-flip error correcting code. NEW JOURNAL OF PHYSICS, 25 (10). No. 103004. ISSN 1367-2630
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Abstract
In this theoretical study, we explore the use of quantum code-based memories to enhance the lifetime of qubits and exceed the break-even point, which is critical for the implementation of fault-tolerant quantum computing. Specifically, we investigate the quantum phase-flip repetition code as a quantum memory and theoretically demonstrate that it can preserve arbitrary quantum information longer than the lifetime of a single idle qubit in a dephasing-time-limited system, e.g., in semiconductor qubits. Our circuit-based analytical calculations show the efficiency of the phase-flip code as a quantum memory in the presence of relaxation, dephasing, and faulty quantum gates. Moreover, we identify the optimal repetition number of quantum error correction cycles required to reach the break-even point by considering the gate error probabilities of current platforms for quantum computing. Our results provide guidelines for developing quantum memories in semiconductor quantum devices.
Item Type: | Article |
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Additional Information: | Export date: 08 March |
Uncontrolled Keywords: | error correction, repetition code, phase-flip code, break-even point |
Subjects: | Q Science / természettudomány > QC Physics / fizika |
SWORD Depositor: | MTMT SWORD |
Depositing User: | MTMT SWORD |
Date Deposited: | 18 Sep 2024 11:50 |
Last Modified: | 18 Sep 2024 11:50 |
URI: | https://real.mtak.hu/id/eprint/205138 |
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