Huszank, Robert and Csedreki, László and Kertész, Zsófia and Török, Zs. (2016) Determination of the density of silicon–nitride thin films by ion-beam analytical techniques (RBS, PIXE, STIM). JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY, 306 (1). pp. 341-346. ISSN 0236-5731 (print), 1588-2780 (online)
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Official URL: http://link.springer.com/article/10.1007%2Fs10967-...
| Item Type: | Article |
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| Subjects: | Q Science / természettudomány > QC Physics / fizika |
| Depositing User: | Dr Zsófia Kertész |
| Date Deposited: | 25 Sep 2015 04:31 |
| Last Modified: | 06 Jul 2016 16:53 |
| URI: | http://real.mtak.hu/id/eprint/27791 |
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