Characterization of the microstructure of severely deformed titanium by X-ray diffraction profile analysis

Gubicza, Jenő and Dragomir, I. C. and Ribárik, Gábor and Zhu, Y. T. and Valiev, R. Z. and Ungár, Tamás (2003) Characterization of the microstructure of severely deformed titanium by X-ray diffraction profile analysis. In: 3rd Hungarian Conference and Exhibition on Materials Science, Testing and Informatics, 2001. október 14-17., Balatonfüred, Magyarország.

PDF 1006654.pdf Restricted to Registered users only Download (127kB) | Request a copy

Abstract

Nanocrystalline titanium was produced by equal channel angular pressing (ECAP). It was found that during ECAP a texture evolved in the specimen in which the hexagonal "c" axis is perpendicular to the extrusion direction. The crystallite size distribution and the dislocation structure were determined by fitting ab-initio theoretical functions to the Fourier coefficients of the measured X-ray diffraction peak profiles. The peak profile analysis provided the median and the variance of the crystallite size distribution: m=38 nm and sigma=0.49, respectively. The dislocation slip system population was found to be 75% <a> type, 20% <c> type and 5% <c+a> type.

Actions (login required)

Edit Item