Szilágyi, Edit and Bányász, István and Kótai, Endre and Németh, Attila and Major, Csaba and Fried, Miklós and Battistig, Gábor (2015) Determination of migration of ion-implanted Ar and Zn in silica by backscattering spectrometry. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 170 (3). pp. 229-237. ISSN 1042-0150
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Official URL: http://dx.doi.org/10.1080/10420150.2015.1039534
| Item Type: | Article |
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| Subjects: | Q Science / természettudomány > QC Physics / fizika Q Science / természettudomány > QD Chemistry / kémia > QD02 Physical chemistry / fizikai kémia |
| SWORD Depositor: | MTMT SWORD |
| Depositing User: | MTMT SWORD |
| Date Deposited: | 05 Jan 2016 12:27 |
| Last Modified: | 05 Jan 2016 12:27 |
| URI: | http://real.mtak.hu/id/eprint/31764 |
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