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TEM INVESTIGATION OF GRAIN AND DEFECT STRUCTURE IN ELECTRODEPOSITED NANOCRYSTALLINE NICKEL

Kolonits, Tamás and Jenei, Péter and G. Tóth, Bence and Czigány, Zsolt and Gubicza, Jenő (2015) TEM INVESTIGATION OF GRAIN AND DEFECT STRUCTURE IN ELECTRODEPOSITED NANOCRYSTALLINE NICKEL. In: 12th Multinational Congress on Microscopy. Akadémiai Kiadó, Budapest, pp. 456-458. ISBN 978-963-05-9653-4

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Item Type: Book Section
Subjects: Q Science / természettudomány > QC Physics / fizika
SWORD Depositor: MTMT SWORD
Depositing User: MTMT SWORD
Date Deposited: 07 Jun 2016 14:29
Last Modified: 07 Jun 2016 14:29
URI: http://real.mtak.hu/id/eprint/36004

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