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STRUCTURAL CHARACTERIZATION OF TiC-BASED THIN FILMS BY TEM AND HREM

Oláh, Nikolett and Veres, Miklós and Sulyok, Attila and Fogarassy, Zsolt and Kaptay, George and Balázsi, Katalin (2015) STRUCTURAL CHARACTERIZATION OF TiC-BASED THIN FILMS BY TEM AND HREM. In: 12th Multinational Congress on Microscopy. Akadémiai Kiadó, Budapest, pp. 148-150. ISBN 978-963-05-9653-4

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Item Type: Book Section
Subjects: Q Science / természettudomány > QC Physics / fizika
Q Science / természettudomány > QC Physics / fizika > QC02 Optics / fénytan
SWORD Depositor: MTMT SWORD
Depositing User: MTMT SWORD
Date Deposited: 13 Jun 2016 09:02
Last Modified: 13 Jun 2016 09:02
URI: http://real.mtak.hu/id/eprint/36309

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