Fodor, Bálint and Defforge, Thomas and Agócs, Emil and Fried, Miklós and Gautier, Gaël and Petrik, Péter (2016) Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires. APPLIED SURFACE SCIENCE. pp. 1-8. ISSN 0169-4332
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Official URL: http://dx.doi.org/10.1016/j.apsusc.2016.12.063
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | Birefringence; Anisotropy; In-depth gradient; MORPHOLOGY; Effective Medium Approximation; SILICON NANOWIRES; Porous silicon layer; spectroscopic ellipsometry |
| Subjects: | Q Science / természettudomány > QC Physics / fizika Q Science / természettudomány > QD Chemistry / kémia > QD02 Physical chemistry / fizikai kémia |
| SWORD Depositor: | MTMT SWORD |
| Depositing User: | MTMT SWORD |
| Date Deposited: | 11 Jan 2017 14:43 |
| Last Modified: | 11 Jan 2017 14:43 |
| URI: | http://real.mtak.hu/id/eprint/45112 |
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