Microstructure of diamond–SiC nanocomposites determined by X-ray line profile analysis

Gubicza, Jenő and Ungár, Tamás and Wang, Y. and Voronin, G. and Pantea, C. and Zerda, T.W. (2006) Microstructure of diamond–SiC nanocomposites determined by X-ray line profile analysis. Diamond and Related Materials, 15 (9). pp. 1452-1456. ISSN 0925-9635

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Abstract

Diamond composites with nanosize diamond crystals and nanosize SiC matrix were obtained at 8 GPa and temperatures varied between 1800 and 2000 degrees C. Multiple Whole Profile fitting method applied to X-ray diffractograms of sintered composites provided information on crystallite size and population of dislocations. When the temperature was increased at a constant pressure, it led to a growth of crystallite sizes in both phases and reduced population of dislocations. Porosity was limiting hardness of the specimens indicating importance of sample preparation prior to sintering nanosize diamond powders.

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