Ungár, Tamás and Schafler, E. and Gubicza, Jenő (2009) Microstructure of Bulk Nanomaterials Determined by X-Ray Line Profile Analysis. In: Bulk nanostructured materials. Wiley-VCH, Weinheim, pp. 361-386. ISBN 978-3-527-31524-6
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| Item Type: | Book Section |
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| Subjects: | Q Science / természettudomány > QC Physics / fizika |
| Depositing User: | Erika Bilicsi |
| Date Deposited: | 03 Apr 2013 12:00 |
| Last Modified: | 03 Apr 2013 12:00 |
| URI: | http://real.mtak.hu/id/eprint/4569 |
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