Szász, András and Kojnok, J. (1985) Soft X-ray emission depth profile analysis: SXDA. APPLIED SURFACE SCIENCE, 24. pp. 34-56. ISSN 0169-4332
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Item Type: | Article |
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Subjects: | Q Science / természettudomány > QC Physics / fizika Q Science / természettudomány > QC Physics / fizika > QC06 Physics of condensed matter / szilárdtestfizika |
SWORD Depositor: | MTMT SWORD |
Depositing User: | MTMT SWORD |
Date Deposited: | 26 Aug 2013 13:47 |
Last Modified: | 26 Aug 2013 13:47 |
URI: | http://real.mtak.hu/id/eprint/6305 |
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