Medgyes, Bálint and Szivós, Dániel and Ádám, Sándor and Tar, Lajos and Tamási, Patrik and Berényi, Richárd and Harsányi, Gábor (2016) Electrochemical migration of Sn and Ag in NaCl environment. In: IEEE 22nd International Symposium for Design and Technology in Electronic Packaging (SIITME). IEEE, New York, pp. 274-278. ISBN 978-150904445-0
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Abstract
The impact of chloride ion concentration on electrochemical migration (ECM) of tin and silver was studied by using an in-situ optical and electrical inspection system. It was found, that in both cases, dendrites grow not only in an electrolyte solution at low chloride concentration but also in an electrolyte at medium and high or even saturated chloride concentrations as well. According to the results, the migration susceptibility has decreased at low and medium concentration levels in both cases. However, the ECM susceptibility of Ag has increased, while the migration susceptibility of Sn was decreased at the saturated concentrations.
| Item Type: | Book Section |
|---|---|
| Subjects: | T Technology / alkalmazott, műszaki tudományok > TK Electrical engineering. Electronics Nuclear engineering / elektrotechnika, elektronika, atomtechnika |
| SWORD Depositor: | MTMT SWORD |
| Depositing User: | MTMT SWORD |
| Date Deposited: | 20 Sep 2017 12:47 |
| Last Modified: | 20 Sep 2017 12:47 |
| URI: | http://real.mtak.hu/id/eprint/63113 |
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