Sipkás, Vivien and Bognár, Gabriella (2018) The Application of Accelerated Life Testing Method for Micro Switches. INTERNATIONAL JOURNAL OF INSTRUMENTATION AND MEASUREMENT, 3. pp. 1-5. ISSN 2534-8841
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| Item Type: | Article |
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| Additional Information: | Vadászné Bognár Gabriella |
| Subjects: | T Technology / alkalmazott, műszaki tudományok > TK Electrical engineering. Electronics Nuclear engineering / elektrotechnika, elektronika, atomtechnika |
| SWORD Depositor: | MTMT SWORD |
| Depositing User: | MTMT SWORD |
| Date Deposited: | 23 Jul 2018 07:58 |
| Last Modified: | 23 Jul 2018 07:58 |
| URI: | http://real.mtak.hu/id/eprint/82350 |
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