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Retention Behaviour of MNOS Memory Devices with Embedded Si or Ge Nanocrystals – Computer Simulation

Turmezei, P. J. and Molnár, K. Z. and Horváth, Zsolt József and Kovács, B. (2013) Retention Behaviour of MNOS Memory Devices with Embedded Si or Ge Nanocrystals – Computer Simulation. PROCEEDINGS OF THE INTERNATIONAL CONFERENCE NANOMATERIALS : APPLICATIONS AND PROPERTIES, 2 (4). No.-04NAESP14. ISSN 2304-1862

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Item Type: Article
Subjects: T Technology / alkalmazott, műszaki tudományok > TK Electrical engineering. Electronics Nuclear engineering / elektrotechnika, elektronika, atomtechnika
SWORD Depositor: MTMT SWORD
Depositing User: MTMT SWORD
Date Deposited: 04 Jan 2014 15:02
Last Modified: 09 Jan 2014 14:22
URI: http://real.mtak.hu/id/eprint/8354

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