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Items where Author is "Bosi, M."

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Number of items: 5.

Article

Seravalli, L. and Ugolotti, A. and Bergamaschini, R. and Bosi, M. and Cora, Ildikó and Mezzadri, F. and Mazzolini, P. and Cademartiri, L. and Bertoni, I. and Fogarassy, Zsolt and Pécz, Béla and Bierwagen, O. and Ardenghi, A. and Leone, S. and Nasi, L. and Miglio, L. and Fornari, R. (2025) Supersaturation-Dependent Competition between β and κ Phases in the MOVPE Growth of Ga2O3 on Al2O3 (0001) and GaN (0001) Substrates. ACS APPLIED MATERIALS & INTERFACES. ISSN 1944-8244 (In Press)

Zolnai, Zs. and Petrik, P. and Németh, A. and Volk, J. and Bosi, M. (2023) Atomic Structure and Annealing-Induced Reordering of ε-Ga2O3: A Rutherford Backscattering/Channeling and Spectroscopic Ellipsometry Study. APPLIED SURFACE SCIENCE, 636. No.-157869. ISSN 0169-4332 (print); 1873-5584 (online)

Cora, Ildikó and Fogarassy, Zsolt and Fornari, R. and Bosi, M. and Rečnik, A. and Pécz, Béla (2020) In situ TEM study of κ→β and κ→γ phase transformations in Ga2O3. Acta Materialia, 183. pp. 216-227. ISSN 1359-6454

Bosi, M. and Attolini, G. and Negri, M. and Ferrari, C. and Buffagni, E. and Pécz, Béla and Riesz, Ferenc (2016) Defect structure and strain reduction of 3C-SiC/Si layers obtained with the use of a buffer layer and methyltrichlorosilane addition. CRYSTENGCOMM. pp. 1-10. ISSN 1466-8033

Sophia, P. Joice and Attolini, G. and Bosi, M. and Buffagni, E. and Ferrari, C. and Vad, Kálmán and Csik, Attila and Takáts, Viktor and Zolnai, Zsolt (2015) Influence of surface roughness on interdiffusion processes in InGaP/Ge heteroepitaxial thin films. ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 4 (3). P53-P56. ISSN 2162-8769

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