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Items where Author is "Cayrel, F."

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Fodor, Bálint and Cayrel, F. and Agócs, Emil and Alquier, D. and Fried, Miklós and Petrik, Péter (2014) Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride. THIN SOLID FILMS, 571. pp. 567-572. ISSN 0040-6090

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