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Items where Author is "Jablonski, Alexander"
Group by: Item Type | No Grouping Number of items: 1. Zommer, Ludomir and Jablonski, Alexander and Kotysh, László and Sáfrán, György and Menyhárd, Miklós (2010) Simulation and measurement of AES depth profiles; a case study of the C/Ta/C/Si system. Surface Science, 604 (7-8). pp. 633-640. ISSN 0039-6028 |
