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Items where Author is "Jacques, Alain"
Group by: Item Type | No Grouping Number of items: 2. Eloh, Komlavi Senyo and Jacques, Alain and Ribarik, Gabor and Berbenni, Stephane (2018) The Effect of Crystal Defects on 3D High-Resolution Diffraction Peaks: A FFT-Based Method. Materials, 11 (9). No. 1669. ISSN 1996-1944, ESSN: 1996-1944 Trehorel, Roxane and Ribarik, Gabor and Schenk, Thomas and Jacques, Alain (2018) Real-time study of transients during high-temperature creep of an Ni-base superalloy by far-field high-energy synchrotron X-ray diffraction. Journal of Applied Crystallography, 51. pp. 1274-1282. ISSN 0021-8898, ESSN: 1600-5767 |
