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Items where Author is "Kiss, Ákos Koppány"
Group by: Item Type | No Grouping Jump to: Article | Book Section Number of items: 6. ArticleKiss, Ákos Koppány and Lábár, János (2016) Determining Projections of Grain Boundaries from Diffraction Data in Transmission Electron Microscope. MICROSCOPY AND MICROANALYSIS, 22. pp. 551-564. ISSN 1431-9276 Kiss, Ákos Koppány and Rauch, Edgar F. and Lábár, János (2016) Highlighting material structure with transmission electron diffraction correlation coefficient maps. Ultramicroscopy. pp. 1-12. ISSN 0304-3991 Kiss, Ákos Koppány and Rauch, Edgar F. and Pécz, Béla and Szívós, János and Lábár, János (2015) A Tool for Local Thickness Determination and Grain Boundary Characterization by CTEM and HRTEM Techniques. MICROSCOPY AND MICROANALYSIS, 21 (2). pp. 422-435. ISSN 1431-9276 Lábár, János and Kiss, Ákos Koppány and Christiansen, Silke and Falk, Fritz (2012) Characterization of Grain Boundary Geometry in the TEM, exemplified in Si thin films. SOLID STATE PHENOMENA, 186. pp. 7-12. ISSN 1012-0394 Book SectionRauch, Edgar and Kiss, Ákos Koppány and Lábár, János (2016) The use of Correlation Coefficient maps to enhance visibility of internal structure for nanocrystalline thin foils. In: European Microscopy Congress 2016: Proceedings. Wiley-VCH Verlag GmbH & Co. KGaA, Lyon, pp. 629-630. ISBN 9783527808465; 9783527342976 Cora, Ildikó and Dódony, István and Tóth, Lajos and Kiss, Ákos Koppány (2015) Study of Si-containing pyrite (FeS2). In: 12th Multinational Congress on Microscopy. Akadémiai Kiadó, Budapest, pp. 275-276. ISBN 978-963-05-9653-4 |
