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Items where Author is "Knaup, J. M."

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Knaup, J. M. and Deák, Peter and Gali, Ádám and Hajnal, Zoltán and Frauenheim, Thomas and Choyke, W. J. (2005) The Search for Near Interface Oxide Traps - First-Principles Calculations on Intrinsic SiO2 Defects. Materials Science Forum, 483-85. pp. 569-572. ISSN 0255-5476

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