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Items where Author is "Novikov, A. V."
Group by: Item Type | No Grouping Jump to: Article Number of items: 1. ArticleDrozdov, M. N. and Drozdov, Y. N. and Csík, Attila and Novikov, A. V. and Vad, Kálmán (2016) Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry. THIN SOLID FILMS, 607. pp. 25-31. ISSN 0040-6090 |
