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Items where Author is "Schellenberger, M."
Group by: Item Type | No Grouping Jump to: Article Number of items: 2. ArticleRosu, D. and Petrik, Péter and Rattmann, G. and Schellenberger, M. and Beck, U. (2014) Optical characterization of patterned thin films. THIN SOLID FILMS, 571 (P3). pp. 601-604. ISSN 0040-6090 Gumprechte, T. and Petrik, Péter and Roeder, G. and Schellenberger, M. and Pfitzner, L. and Pollakowski, B. and Beckhoff, B. (2013) Characterization of thin ZnO films by vacuum ultra-violet reflectometry. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, 1494. pp. 65-70. ISSN 0272-9172 |
