  |
Items where Author is "Yakimova, R."
Group by: Item Type | No Grouping Number of items: 1. Kotysh, László and Gurbán, Sándor and Pécz, Béla and Menyhárd, Miklós and Yakimova, R. (2014) Determination of the thickness distribution of a graphene layer grown on a 2" SiC wafer by means of Auger electron spectroscopy depth profiling. APPLIED SURFACE SCIENCE, 316. pp. 301-307. ISSN 0169-4332 |
