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Basa, Péter and Alagoz, A. S. and Lohner, Tivadar and Kulakci, M. and Turan, R. and Horváth, Zsolt József (2008) Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals. APPLIED SURFACE SCIENCE, 254 (12). pp. 3626-3629. ISSN 0169-4332

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