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Optical Characterization of Oxide-Based Materials Using Ellipsometry

Petrik, Péter (2020) Optical Characterization of Oxide-Based Materials Using Ellipsometry. In: Oxide-Based Materials and Structures : Fundamentals and Applications. CRC Press, Boca Raton (FL), pp. 5-29. ISBN 9780429286728

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Item Type: Book Section
Subjects: Q Science / természettudomány > QC Physics / fizika > QC02 Optics / fénytan
SWORD Depositor: MTMT SWORD
Depositing User: MTMT SWORD
Date Deposited: 03 Aug 2020 09:53
Last Modified: 03 Aug 2020 09:53
URI: http://real.mtak.hu/id/eprint/111899

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