Petrik, Péter (2020) Optical Characterization of Oxide-Based Materials Using Ellipsometry. In: Oxide-Based Materials and Structures : Fundamentals and Applications. CRC Press, Boca Raton (FL), pp. 5-29. ISBN 9780429286728
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9780367252397_proofs_1-Petrik.pdf Restricted to Repository staff only Download (978kB) |
Item Type: | Book Section |
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Subjects: | Q Science / természettudomány > QC Physics / fizika > QC02 Optics / fénytan |
SWORD Depositor: | MTMT SWORD |
Depositing User: | MTMT SWORD |
Date Deposited: | 03 Aug 2020 09:53 |
Last Modified: | 03 Aug 2020 09:53 |
URI: | http://real.mtak.hu/id/eprint/111899 |
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