REAL

Substrate-induced strain in carbon nanodisks

Osváth, Zoltán and Vértesy, Zofia and Lábár, János and Nemes Incze, Péter and Horváth, Zsolt Endre and Biró, László Péter (2014) Substrate-induced strain in carbon nanodisks. THIN SOLID FILMS, 565. pp. 111-115. ISSN 0040-6090

[img]
Preview
Text
TSF_Substrate_Accepted manuscript.pdf

Download (521Kb) | Preview

Abstract

Abstract Graphitic nanodisks of typically 20 – 50 nm in thickness, produced by the so-called Kvaerner Carbon Black and Hydrogen Process were dispersed on gold substrate and investigated by atomic force microscopy (AFM), field emission scanning electron microscopy (FE-SEM), and confocal Raman spectroscopy. The roughness of the gold surface was drastically changed by annealing at 400 °C. AFM measurements show that this change in the surface roughness induces changes also in the topography of the nanodisks, as they closely follow the corrugation of the gold substrate. This leads to strained nanodisks, which is confirmed also by confocal Raman microscopy. We found that the FE-SEM contrast obtained from the disks depends on the working distance used during the image acquisition by In-lens detection, a phenomenon which we explain by the decrease in the amount of electrons reaching the detector due to diffraction. This process may affect the image contrast in the case of other layered materials, like hexagonal boron nitride, and other planar hybrid nanostructures, too.

Item Type: Article
Uncontrolled Keywords: Field-Emission Scanning Electron Microscopy; Raman scattering; atomic force microscopy; Carbon Nanodisks
Subjects: Q Science / természettudomány > QC Physics / fizika
T Technology / alkalmazott, műszaki tudományok > T2 Technology (General) / műszaki tudományok általában
SWORD Depositor: MTMT SWORD
Depositing User: MTMT SWORD
Date Deposited: 15 Jul 2014 08:23
Last Modified: 24 May 2016 10:42
URI: http://real.mtak.hu/id/eprint/13731

Actions (login required)

View Item View Item