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Electron microscopy study of Ni induced crystallization in amorphous Si thin films

Radnóczi, György Zoltán and Dodony, Erzsébet and Battistig, Gábor and Vouroutzis, N. and Stoemenos, J. and Kovács, András and Pécz, Béla (2015) Electron microscopy study of Ni induced crystallization in amorphous Si thin films. In: INTERNATIONAL CONFERENCES AND EXHIBITION ON NANOTECHNOLOGIES & ORGANIC ELECTRONICS (NANOTEXNOLOGY 2014). AIP Publishing, Thessaloniki, pp. 31-37. ISBN 978-0-7354-1285-9

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Item Type: Book Section
Subjects: T Technology / alkalmazott, műszaki tudományok > T2 Technology (General) / műszaki tudományok általában
SWORD Depositor: MTMT SWORD
Depositing User: MTMT SWORD
Date Deposited: 15 Jan 2016 11:41
Last Modified: 15 Jan 2016 11:41
URI: http://real.mtak.hu/id/eprint/32359

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