Rácz, A. S. and Fogarassy, Zs. and Panjan, P. and Menyhárd, M. (2022) Evaluation of AES Depth Profiles with Serious Artefacts in C/W Multilayers. APPLIED SURFACE SCIENCE : A JOURNAL DEVOTED TO APPLIED PHYSICS AND CHEMISTRY OF SURFACES AND INTERFACES. pp. 1-30. ISSN 0169-4332 (print); 1873-5584 (online) (In Press)
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Official URL: https://doi.org/10.1016/j.apsusc.2021.152385
| Item Type: | Article |
|---|---|
| Subjects: | Q Science / természettudomány > QD Chemistry / kémia > QD02 Physical chemistry / fizikai kémia |
| SWORD Depositor: | MTMT SWORD |
| Depositing User: | MTMT SWORD |
| Date Deposited: | 17 Jan 2022 08:13 |
| Last Modified: | 17 Jan 2022 08:13 |
| URI: | http://real.mtak.hu/id/eprint/135953 |
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